Test Capability
Test Hardware/Load Board Development
- Design and generate schematic
- Reverse Engineering
- Load board construction (hand wire type)
Test Software Development
- Develop test program from scratch based on datasheet
- Develop Test Solution and create test plan
- Test Program Migration or conversion
Qualification & correlation of new test program and load board
- Design and generate schematic
- Reverse Engineering
- Load board construction (hand wire type)
Experience in the following product types
- Analog Switches, Video Amplifier, Step Down Converter
- Voltage Regulator/Reference (FT and Wafer Probing), Switching Regulator
- HV Current Sensing Single Driver, MOSFET Driver
- Low Power Thermostat, Linear Battery Charger Controller, Temperature Sensor
- Discrete (FET, Diode, Thyristor)
Electrical Test Capability - Discrete Device
| Standard DC Test | DC High Voltage Test | DC High Current Test | ||||
|---|---|---|---|---|---|---|
| Device Type | Measurement Range | Forcing Range | Measurement Range | Forcing Range | Measurement Range | Forcing Range |
| FET | 20A / 1000V | 20A / 1000V | 10mA / 3KV | 10mA / 3KV | 10A / 20V | 200A / 25V |
| Transistor | 20A / 1000V | 20A / 1000V | 10mA / 3KV | 10mA / 3KV | 20V | 200A / 25V |
| Thyristor | 200mA / 1000V | 20A / 1000V | 10mA / 3KV | 10mA / 3KV | 20V | 200A |
| Opto-coupler | 200mA / 1000V | 20A / 1000V | NA | NA | NA | NA |
| Voltage Regulator | 20A / 20V | 20A / 80V | NA | NA | NA | NA |
| Diode | 10mA / 1000V | 20A / 1000V | 10mA / 3KV | 10mA / 3KV | 20V | 200A |
Electrical Test Capability
| HIPOT / Withstanding Voltage Testing | |||
|---|---|---|---|
| ACW Voltage Test | DCW Voltage Test | ||
| Forcing Range | Measurement Range | Forcing Range | Measurement Range |
| 0.0kV - 5.5kV | 0.01mA - 110mA | 0.0kV - 6.2kV | 0.01mA - 110mA |
| Switching Test | ||
|---|---|---|
| Unclamped Inductive Switching (UIS Test) | ||
| Current Range | Voltage Range | Load Inductance Range |
| DCW Voltage Test | 0.0kV - 6.2kV | 0.01mA - 110mA |
| TVS Clamping Voltage Testing | ||
|---|---|---|
| Pulses | Forcing range for the lpp | Measurement range for the Clamping Voltage |
| 10x1000uS 6x7uS 8x20uS | 0.0kV - 6.2kV | 0.01mA - 110mA |
| Thermal Resistance Test For Transistors, Diodes, MOSFETs and IGBTs | |||||
|---|---|---|---|---|---|
| ΔVF / ΔVCE / ΔVBE / ΔVSD/ ΔVGS | |||||
| Forcing Voltage | Forcing Current | Sensing Current | Power dissipation time | Delay Time | Measurement range |
| 1 – 200V | 0.001 – 50A | 1 to 100mA (1 to 400mA for ΔVCE) | 300uS to 9.99s | 10 to 999uS | 0 – 999mV |
Wafer Sort Capability
| Handlers | |||
|---|---|---|---|
| Manufacturer & Model | Package Type | Contact Sites | Temperature range |
| EG4080 | 4-8” wafers, MLP; DFN; QFN; CSP | Multi | Room temp |
| EG4200 | 4-8” wafers, MLP; DFN; QFN; CSP | Multi | Room, hot and cold temp |
Final Test Package Capability
| Test Handlers | |||
|---|---|---|---|
| Manufacturer & Model | Package Type | Contact Sites | Temperature range |
| MCT 5100 | MSOP/SOIC/TSSOP/DFN | Dual Site | Room, hot temp |
| RASCO SO1000T | MSOP/4X4 / 3X3 / 4X6 | Quad Site | Room, hot and cold temp |
| RASCO SO2000T | QSOP/SOIC | Quad Site | Room, hot and cold temp |
| Test Handlers | |||
|---|---|---|---|
| Manufacturer & Model | Package Type | Contact Sites | Temperature range |
| TESEC9512 (In-line Marking) | TO-220 2L/3L TO-247 2L/3L/4L | 6 Sites index-parallel | Room temp |
| TESEC9718 (In-line marking and Tape and reel) | SOT-223 / SOT23 3L | Single | Room temp |
| TAESUK THD-111 | TO-92 | Single | Room temp |
| SHINJA JT100 / SHINJA ST400 (T&r) | SOT-89 | Single | Room temp |
Test/Added Value Services
- New Product Qualification
- Test Yield Improvement
- Test Datalog and Statistical Analysis
- 24-hour Failure Analysis
- We can expand our test capability on other analog/linear and mixed signal devices