Semicon - Test Services

Semicon Standard Test Services - Test Program Generation and Hardware Development - Test Program Debugging and Optimization - Test Program Platform Conversion - New Device Correlation and Qualification - In depth Product Engineering - 24-Hour Failure Analysis - Test Yield Improvements - FT Data Logs and Statistics Analysis - Correlation to Wafer Probe and Fab Yields - Primary test Platforms TMT, LTX and TESEC - Delta Vf, UIL/UIS and TRR test for MOSFET devices

Reliability Test and Services - Temperature Cycle Test -  Pressure Cocker Test / Unbiased Autoclaved - Solderability Test - (Unbiased) High  Temperature Storage Life Test - (Unbiased) Temperature / Humidity Test - Resistance to Soldering Heat Test or Board Mount Simulation Test - Lead Fatigue Test - Mark Permanency Test